The School of Polymer Science and Engineering operates a state-of-the-art 10m Xenocs
Xeuss 2.0 SAXS/WAXS lab beamline. The beamline facility is accessible to academic,
government, and industrial researchers interested in characterization of nanostructure
in polymers and soft matter.
Faculty Contact: Dr. Xiaodan Gu (xiaodan.guFREEMississippi)
Instrument Location: PSRC 238
Technical Specifications and Features of the Xeuss 2.0
X-Ray source: Microfocused Cu K-alpha
Detector: Pilatus 1M detector and Pilatus 300k detector
Accessible Size Scale: 0.15nm to 600nm, or Q range: 0.001 to 4 A-1
Sample Environments: Linkam heating/cooling stage (-100 to 350 C), Linkam tensile stage, liquid flow cell for solution scattering, grazing incidence scattering stage, rotation stage.
Sample Requirement: powder samples, molded bulk film, solution, polymer thin film on substrate.
What information can x-ray scattering provide for your research?
- Determine the crystalline structure and degree of crystallinity for polymers in bulk and thin film state
- Determine the phase of self-assembled block-copolymers or liquid crystalline polymers
- Reveal spatially resolved structural variations due to processing such as injection molding
- Test the tensile properties of polymers or follow the degree of crystallinity during controlled cooling
- Investigate thickness and morphology of polymer and composite films
- Characterize the size, shape and distribution of rubber-fillers or polymeric colloids and micelles in dispersion